Journal
ADVANCED SCIENCE
Volume 8, Issue 14, Pages -Publisher
WILEY
DOI: 10.1002/advs.202100139
Keywords
complex optical media; Fourier imaging; Raman scattering; random optical media; silicon nanowires; weak localization of light
Categories
Funding
- Royal Society [IE160225]
- project STBIC-P.O. FSE 2014/2020 [PON ARS01_00459 ADAS]
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The authors directly imaged the optical properties of a random network of silicon nanowires using real-space microscopy and Fourier imaging, revealing the light transport mechanisms and weak localization length. The study demonstrated the out-of-plane beaming of scattered coherent Raman light, offering novel opportunities for fundamental studies of light propagation in disordered media.
Disordered optical media are an emerging class of materials that can strongly scatter light. These materials are useful to investigate light transport phenomena and for applications in imaging, sensing and energy storage. While coherent light can be generated using such materials, its directional emission is typically hampered by their strong scattering nature. Here, the authors directly image Rayleigh scattering, photoluminescence and weakly localized Raman light from a random network of silicon nanowires via real-space microscopy and Fourier imaging. Direct imaging enables us to gain insight on the light transport mechanisms in the random material, to visualize its weak localization length and to demonstrate out-of-plane beaming of the scattered coherent Raman light. The direct visualization of coherent light beaming in such random networks of silicon nanowires offers novel opportunities for fundamental studies of light propagation in disordered media. It also opens venues for the development of next generation optical devices based on disordered structures, such as sensors, light sources, and optical switches.
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