Journal
MATERIALS
Volume 14, Issue 6, Pages -Publisher
MDPI
DOI: 10.3390/ma14061505
Keywords
Y2O3; Eu; phosphor; photoluminescence; electroluminescence; atomic layer deposition
Categories
Funding
- European Union [76495]
Ask authors/readers for more resources
This study reports the fabrication of red Y2O3:Eu thin film phosphors and multilayer structure Y2O3:Eu-based electroluminescent devices by atomic layer deposition at 300 degrees C. The results show a polycrystalline structure of the films and emission above 570 nm, with red electroluminescent devices achieving luminance up to 40 cd/m(2) at a driving frequency of 1 kHz and an efficiency of 0.28 Lm/W. The research demonstrates the potential applications of these red electroluminescent devices.
Y2O3:Eu is a promising red-emitting phosphor owing to its high luminance efficiency, chemical stability, and non-toxicity. Although Y2O3:Eu thin films can be prepared by various deposition methods, most of them require high processing temperatures in order to obtain a crystalline structure. In this work, we report on the fabrication of red Y2O3:Eu thin film phosphors and multilayer structure Y2O3:Eu-based electroluminescent devices by atomic layer deposition at 300 degrees C. The structural and optical properties of the phosphor films were investigated using X-ray diffraction and photoluminescence measurements, respectively, whereas the performance of the fabricated device was evaluated using electroluminescence measurements. X-ray diffraction measurements show a polycrystalline structure of the films whereas photoluminescence shows emission above 570 nm. Red electroluminescent devices with a luminance up to 40 cd/m(2) at a driving frequency of 1 kHz and an efficiency of 0.28 Lm/W were achieved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available