4.6 Article

Nanoscale Piezoelectric Properties and Phase Separation in Pure and La-Doped BiFeO3 Films Prepared by Sol-Gel Method

Journal

MATERIALS
Volume 14, Issue 7, Pages -

Publisher

MDPI
DOI: 10.3390/ma14071694

Keywords

bismuth ferrite; La-doping; piezoelectricity; sol– gel

Funding

  1. FCT/MCTES [UIDB/50011/2020, UIDP/50011/2020]
  2. European Union's Horizon 2020 research and innovation programme under the Marie Sklodowska-Curie grant [778070]
  3. RFBR [20-58-0061]
  4. BRFBR [T20R-359]
  5. national funds (OE), through FCT-Fundacao para a Ciencia e a Tecnologia, I.P.

Ask authors/readers for more resources

La doping and higher crystallization temperature result in increased grain size and preferred orientation, while decreasing effective piezoelectric coefficient and increasing non-polar phase surface area. La doping enhances grain size and self-polarization, important for future piezoelectric applications.
Pure BiFeO3 (BFO) and doped Bi0.9La0.1FeO3 (BLFO) thin films were prepared on Pt/TiO2/SiO2/Si substrates by a modified sol-gel technique using a separate hydrolysis procedure. The effects of final crystallization temperature and La doping on the phase structure, film morphology, and nanoscale piezoelectric properties were investigated. La doping and higher crystallization temperature lead to an increase in the grain size and preferred (102) texture of the films. Simultaneously, a decrease in the average effective piezoelectric coefficient (about 2 times in La-doped films) and an increase in the area of surface non-polar phase (up to 60%) are observed. Phase separation on the films' surface is attributed to either a second phase or to a non-polar perovskite phase at the surface. As compared with undoped BFO, La-doping leads to an increase in the average grain size and self-polarization that is important for future piezoelectric applications. It is shown that piezoelectric activity is directly related to the films' microstructructure, thus emphasizing the role of annealing conditions and La-doping that is frequently used to decrease the leakage current in BFO-based materials.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available