Journal
ADVANCED ENERGY MATERIALS
Volume 11, Issue 19, Pages -Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/aenm.202003489
Keywords
charge transfer; charge‐ carrier lifetime; decay time; interface charging; interfacial recombination; non‐ radiative voltage losses; photovoltaics; time‐ resolved photoluminescence
Categories
Funding
- PEROSEED
- Projekt DEAL
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Researchers combined numerical simulations, analytical solutions, and experimental data to study different sample geometries, and proposed a method to distinguish the contributions of different recombination, charge extraction, and capacitive effects to decay by analyzing the decay time of TPL decay.
While transient photoluminescence (TPL) measurements are a very popular tool to monitor the charge-carrier dynamics in the field of halide perovskite photovoltaics, interpretation of data obtained on multilayer samples is highly challenging due to the superposition of various effects that modulate the charge-carrier concentration in the perovskite layer and thereby the measured photoluminescence (PL). These effects include bulk and interfacial recombination, charge transfer to electron- or hole transport layers, and capacitive charging or discharging. Here, numerical simulations with Sentauraus TCAD, analytical solutions, and experimental data with a dynamic range of approximate to 7 orders of magnitude on a variety of different sample geometries, from perovskite films on glass to full devices, are combined to present an improved understanding of this method. A presentation of the decay time of the TPL decay that follows from taking the derivative of the photoluminescence at every time is proposed. Plotting this decay time as a function of the time-dependent quasi-Fermi-level splitting enables distinguishing between the different contributions of radiative and non-radiative recombination as well as charge extraction and capacitive effects to the decay.
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