4.5 Article

Suppression of the vacuum space-charge effect in fs-photoemission by a retarding electrostatic front lens

Journal

REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 92, Issue 5, Pages -

Publisher

AIP Publishing
DOI: 10.1063/5.0046567

Keywords

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Funding

  1. Mainz group from Bundesministerium fur Bildung und Forschung (BMBF) [05K19UM1, 05K19UM2]
  2. Deutsche Forschungsgemeinschaft (German Research Foundation) [TRR 173, 268565370]
  3. U.S. Department of Energy, Basic Energy Science [DE-SC0016017]
  4. Deutsche Forschungsgemeinschaft within the Emmy Noether Program [RE 3977/1]
  5. Deutsche Forschungsgemeinschaft [SFB 925-170620586]
  6. U.S. Department of Energy (DOE) [DE-SC0016017] Funding Source: U.S. Department of Energy (DOE)

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This method presents an effective approach to suppress space-charge artifacts in time-resolved photoemission experiments, demonstrating the retention of momentum images of fast photoelectrons by repelling slow electrons using a retarding electrostatic field generated by a special objective lens. The approach enables switching between accelerating and retarding modes, allowing for a substantial increase in slow-electron yield and the exploration of previously inaccessible pump fluences in photoemission experiments. Results show minimal impact on the Fermi edge width at high energies, showcasing the potential of this method for advanced research in the field.
The performance of time-resolved photoemission experiments at fs-pulsed photon sources is ultimately limited by the e-e Coulomb interaction, downgrading energy and momentum resolution. Here, we present an approach to effectively suppress space-charge artifacts in momentum microscopes and photoemission microscopes. A retarding electrostatic field generated by a special objective lens repels slow electrons, retaining the k-image of the fast photoelectrons. The suppression of space-charge effects scales with the ratio of the photoelectron velocities of fast and slow electrons. Fields in the range from -20 to -1100 V/mm for E-kin = 100 eV to 4 keV direct secondaries and pump-induced slow electrons back to the sample surface. Ray tracing simulations reveal that this happens within the first 40 to 3 mu m above the sample surface for E-kin = 100 eV to 4 keV. An optimized front-lens design allows switching between the conventional accelerating and the new retarding mode. Time-resolved experiments at E-kin = 107 eV using fs extreme ultraviolet probe pulses from the free-electron laser FLASH reveal that the width of the Fermi edge increases by just 30 meV at an incident pump fluence of 22 mJ/cm(2) (retarding field -21 V/mm). For an accelerating field of +2 kV/mm and a pump fluence of only 5 mJ/cm(2), it increases by 0.5 eV (pump wavelength 1030 nm). At the given conditions, the suppression mode permits increasing the slow-electron yield by three to four orders of magnitude. The feasibility of the method at high energies is demonstrated without a pump beam at E-kin = 3830 eV using hard x rays from the storage ring PETRA III. The approach opens up a previously inaccessible regime of pump fluences for photoemission experiments. Published under license by AIP Publishing.

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