Multiscale measurements with adjustable x-ray spot size for in situ imaging and diffraction

A large field of view is normally desired for synchrotron x-ray imaging, while a small x-ray spot size is required for x-ray diffraction. A multiscale measurement system with an adjustable x-ray spot size is developed to accommodate different spot size requirements for in situ phase-contrast imaging and diffraction. The centers of a diffraction scintillator with a through-hole and an imaging scintillator are collinear with the x-ray beam. With the proof-of-principle experiments on a magnesium alloy under uniaxial tension, we demonstrate the feasibility of the multiscale measurement system for full azimuthal range diffraction measurements with improved resolution and large field of view strain field measurements via x-ray digital image correlation.

Automated summary

This paper introduces a multiscale measurement system developed to accommodate different size requirements for synchrotron x-ray imaging and x-ray diffraction, allowing for full azimuthal range diffraction measurements and large field of view strain field measurements. Proof-of-principle experiments on a magnesium alloy demonstrate the feasibility of the system.