4.4 Article

Line identification of boron and nitrogen emissions in extreme- and vacuum-ultraviolet wavelength ranges in the impurity powder dropping experiments of the Large Helical Device and its application to spectroscopic diagnostics

Journal

PLASMA SCIENCE & TECHNOLOGY
Volume 23, Issue 8, Pages -

Publisher

IOP Publishing Ltd
DOI: 10.1088/2058-6272/abfd88

Keywords

plasma spectroscopy; extreme ultraviolet; vacuum ultraviolet; magnetically confined fusion; impurity seeding; wall conditioning

Funding

  1. JSPS-CAS Bilateral Joint Research Projects, 'Control of wall recycling on metallic plasma facing materials in fusion reactor,' 2019-2022 [GJHZ201984]
  2. US Department of Energy [DE-AC02-09CH11466]
  3. Princeton University
  4. LHD project [ULPP010, ULFF022]
  5. JSPS KAKENHI [17K14426, 20K03896]
  6. Post-CUP program
  7. Grants-in-Aid for Scientific Research [17K14426, 20K03896] Funding Source: KAKEN

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The impurity powder dropper was installed in the 21st campaign of the Large Helical Device experiment for real-time wall conditioning and edge plasma control. Spectroscopic diagnostics were used to observe line emission from injected impurities, identifying emission lines from B and N ions with B and BN powder injection.
An impurity powder dropper was installed in the 21st campaign of the Large Helical Device experiment (Oct. 2019-Feb. 2020) under a collaboration between the National Institute for Fusion Science and the Princeton Plasma Physics Laboratory for the purposes of real-time wall conditioning and edge plasma control. In order to assess the effective injection of the impurity powders, spectroscopic diagnostics were applied to observe line emission from the injected impurity. Thus, extreme-ultraviolet (EUV) and vacuum-ultraviolet (VUV) emission spectra were analyzed to summarize observable impurity lines with B and BN powder injection. Emission lines released from B and N ions were identified in the EUV wavelength range of 5-300 angstrom measured using two grazing incidence flat-field EUV spectrometers and in the VUV wavelength range of 300-2400 angstrom measured using three normal incidence 20 cm VUV spectrometers. BI-BV and NIII-NVII emission lines were identified in the discharges with the B and BN powder injection, respectively. Useful B and N emission lines which have large intensities and are isolated from other lines were successfully identified as follows: BI (1825.89, 1826.40) angstrom (blended), BII 1362.46 angstrom, BIII (677.00, 677.14, 677.16) angstrom (blended), BIV 60.31 angstrom, BV 48.59 angstrom, NIII (989.79, 991.51, 991.58) angstrom (blended), NIV 765.15 angstrom, NV (209.27, 209.31) angstrom (blended), NVI 1896.80 angstrom, and NVII 24.78 angstrom. Applications of the line identifications to the advanced spectroscopic diagnostics were demonstrated, such as the vertical profile measurements for the BV and NVII lines using a space-resolved EUV spectrometer and the ion temperature measurement for the BII line using a normal incidence 3 m VUV spectrometer.

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