Quantitative phase microscopy using a rotating mask

A simple non-interferometric technique is presented for quantitative phase microscopy. The technique is based on the rotation of a mask after the camera port of a conventional optical microscope to detect the sample-induced wavefront gradient. In addition to the system description, a method is presented for calibrating the sensor and signal processing to obtain the phase from the measurements. As an example, three-dimensional images of polystyrene microspheres immersed in index-matching liquid obtained with a high-numerical aperture objective are shown.

Automated summary

This non-interferometric technique offers a simple way to achieve quantitative phase microscopy by rotating a mask to detect wavefront gradient. The method also includes calibrating the sensor and processing signals for phase extraction. Three-dimensional images of polystyrene microspheres immersed in index-matching liquid were successfully obtained using this technique.