Two novel critical shock models based on Markov renewal processes

In this paper, we investigate systems subject to random shocks that are classified into critical and noncritical categories, and develop two novel critical shock models. Classical extreme shock models and run shock models are special cases of our developed models. The system fails when the total number of critical shocks reaches a predetermined threshold, or when the system stays in an environment that induces critical shocks for a preset threshold time, corresponding to failure mechanisms of the developed two critical shock models respectively. Markov renewal processes are employed to capture the magnitude and interarrival time dependency of environment-induced shocks. Explicit formulas for systems under the two critical shock models are derived, including the reliability function, the mean time to failure and so on. Furthermore, the two critical shock models are extended to the random threshold case and the integrated case where formulas of the reliability indexes of the systems are provided. Finally, a case study of a lithium-ion battery system is conducted to illustrate the proposed models and the obtained results.

Automated summary

This paper investigates systems subject to random shocks, develops two novel critical shock models, and provides failure mechanisms for the systems. Markov renewal processes are used to capture the magnitude and interarrival time dependency of environment-induced shocks. Explicit formulas for system reliability and mean time to failure are derived for the two critical shock models.