Freeform surface adaptive interferometry assisted with simulated annealing-hill climbing algorithm

The freeform surface adaptive interferometer (FSAI) recently has been employed to realize the unknown freeform surface metrology. A near null interferogram should be acquired from the initial interferogram with undistinguished fringes even dark areas. The direct optimization object in FSAI is just the interferogram rather than the focusing intensity characterization in traditional wavefront-sensorless (WFS) adaptive systems. The simulated annealing-hill climbing (SA-HC) mixed algorithm is employed in the FSAI, which has much better convergence than the stochastic parallel gradient descent (SPGD) algorithm, almost as much as the genetic algorithm (GA). At the same time, it is much faster than GA and thus applicable to the test of volume-produced in the optical shop. Simulations and experiments validating the algorithm feasibility are presented.

Automated summary

The FSAI utilizes a mixed SA-HC algorithm for optimization, achieving better convergence than the SPGD algorithm and comparable to the GA algorithm. This approach allows for faster testing of volume-produced optical systems in the optical shop, while simulations and experiments validate its feasibility.