Journal
MATERIALS LETTERS
Volume 288, Issue -, Pages -Publisher
ELSEVIER
DOI: 10.1016/j.matlet.2021.129320
Keywords
CdSe0.2Te0.8 films; Magnetron sputtering; Photovoltaic application; UV-VIS-NIR spectroscopy
Funding
- National Natural Science Foundation of China [11804281, U1731123]
- Chunhui Plan of the Ministry of Education of China [Z2017093, Z2016122]
- Science and Technology Project of Nanchong, China [18YFZJ0036]
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Cadmium chalcogenide thin films (CdSe0.2Te0.8) were successfully deposited on glass substrates by radio frequency magnetron sputtering, exhibiting a cubic zinc-blende structure with no secondary phases. The band gap of CdSe0.2Te0.8 varied slightly with film thickness in the range of 1.41-1.43 eV, making them potentially suitable for use as a photovoltaic absorption layer in ultra-thin solar cells.
Thin films of cadmium chalcogenide (CdSe0.2Te0.8) on glass substrates have been obtained by the radio frequency magnetron sputtering with different thickness. The XRD analysis indicates that the films are cubic zinc-blende structure with no secondary phases. The UV-VIS-NIR results show that the band gap of CdSe0.2Te0.8 varied slightly in the range 1.41-1.43 eV with the film thickness. The as-prepared CdSe0.2Te0.8 could serve as a photovoltaic absorption layer in ultra-thin solar cells. (C) 2021 Elsevier B.V. All rights reserved.
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