4.4 Article

Role of V-defect density on the performance of III-nitride green LEDs on sapphire substrates

Journal

JOURNAL OF CRYSTAL GROWTH
Volume 560, Issue -, Pages -

Publisher

ELSEVIER
DOI: 10.1016/j.jcrysgro.2021.126048

Keywords

Light emitting diodes; Metalorganic chemicalvapour deposition; Nitrides; V-defects; Semiconducting III-V materials

Funding

  1. U.S. Department of Energy [DE-EE0008204]
  2. Solid State Lighting and Energy Electronic Center (SSLEEC)
  3. NSF MRSEC Program of the NSF [DMR 11-21053]
  4. NSF

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The role of V-defect density on the performance of green III-nitride LEDs grown on sapphire substrates was experimentally investigated in this study. Results showed that V-defect engineering has the potential to achieve low forward voltage and long wavelength LEDs on sapphire substrates.
In this study, we experimentally investigated the role of V-defect density on the performance of green III-nitride LEDs grown on sapphire substrates by metalorganic chemical vapor deposition. We systematically varied the threading dislocation (TD) density from 4 x 10(8) to 1 x 10(9) cm(-2) by changing the V/III ratio during initial high temperature GaN growth. A 30-period InGaN/GaN superlattice promoted V-defect formation and growth at TDs, where the density of V-defects was correlated to the TD density. By interrupting the LED growth and examining the surface of the active region, we quantified the average size and density of V-defects. In a series of LEDs, we measured a systematic decrease in forward voltage (V-F) with V-defect density. At a V-defect density of 5.0 x 10(8) cm(-2) and TD density of 1 x 10(9) cm(-2), green LED devices were demonstrated with lambda = 523 nm and V-F = 2.94 V at 20 A cm(-2). These results highlight the potential of using V-defect engineering to achieve low V-F long wavelength LEDs on sapphire substrates, where opening of remaining threading dislocations into V-defects presents an opportunity for further V-F reduction.

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