Crystallization kinetics of amorphous acetonitrile nanoscale films

We measure the isothermal crystallization kinetics of amorphous acetonitrile films using molecular beam dosing and reflection adsorption infrared spectroscopy techniques. Experiments on a graphene covered Pt(111) substrate revealed that the crystallization rate slows dramatically during long time periods and that the overall kinetics cannot be described by a simple application of the Avrami equation. The crystallization kinetics also have a thickness dependence with the thinner films crystallizing much slower than the thicker ones. Additional experiments showed that decane layers at both the substrate and vacuum interfaces can also affect the crystallization rates. A comparison of the crystallization rates for CH3CN and CD3CN films showed only an isotope effect of similar to 1.09. When amorphous films were deposited on a crystalline film, the crystalline layer did not act as a template for the formation of a crystalline growth front. These overall results suggest that the crystallization kinetics are complicated, indicating the possibility of multiple nucleation and growth mechanisms.

Automated summary

Isothermal crystallization kinetics of amorphous acetonitrile films were measured using molecular beam dosing and reflection adsorption infrared spectroscopy techniques. The study found that crystallization rate slows over time, with a thickness dependence and an influence from decane layers at substrate and vacuum interfaces. The overall kinetics were complex, suggesting the possibility of multiple nucleation and growth mechanisms.