4.6 Article

Localized strain profile in surface electrode array for programmable composite multiferroic devices

Journal

APPLIED PHYSICS LETTERS
Volume 118, Issue 18, Pages -

Publisher

AIP Publishing
DOI: 10.1063/5.0039156

Keywords

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Funding

  1. NSF Nanosystems Engineering Research Center for Translational Applications of Nanoscale Multiferroic Systems (TANMS) [EEC-1160504]
  2. Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy [DE-AC02-05CH11231]
  3. Basque Government for the Postdoctoral Fellowship
  4. TANMS Undergraduate Research Program

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This study investigates localized in-plane strains induced by surface electrode arrays on piezoelectrics at the microscale. X-ray microdiffraction studies reveal micrometer-scale strain distribution. Experimental measurements and simulation results show the influence of electrode pair distance, positioning, and neighboring arrangements on regional strain strength and direction.
We investigate localized in-plane strains on the microscale, induced by arrays of biased surface electrodes patterned on piezoelectrics. Particular focus is given to the influence that adjacent electrode pairs have on one another to study the impact of densely packed electrode arrays. We present a series of X-ray microdiffraction studies to reveal the spatially resolved micrometer-scale strain distribution. The strain maps with micrometer-scale resolution highlight how the local strain profile in square regions up to 250 x250 mu m(2) in size is affected by the surface electrodes that are patterned on ferroelectric single-crystal [Pb(Mg1/3Nb2/3)O-3](x)-[PbTiO3](1-x). The experimental measurements and simulation results show the influence of electrode pair distance, positioning of the electrode pair, including the angle of placement, and neighboring electrode pair arrangements on the strength and direction of the regional strain. Our findings are relevant to the development of microarchitected strain-mediated multiferroic devices. The electrode arrays could provide array-addressable localized strain control for applications including straintronic memory, probabilistic computing platforms, microwave devices, and magnetic-activated cell sorting platforms.

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