Journal
ADVANCED MATERIALS
Volume 33, Issue 25, Pages -Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.202100775
Keywords
exciton– polariton; microcavity; perovskite lasers; perovskite microcavities; photonic modes
Categories
Funding
- National Key Research and Development Program [2018YFA0704404]
- Guangdong Major Project of Basic and Applied Basic Research [2020B0301030009]
- National Natural Science Foundation of China [11874074, 11527901, 91750203, 91850111, 61521004]
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Perovskite microcavities exhibit excellent photophysical properties for optoelectronic devices such as nanolasers. This study uses photoemission electron microscopy (PEEM) to image photonic modes within optical microcavities at nanometer-scale resolution, revealing characteristic cavity modes and enabling real-time imaging and control of light focus. By effectively observing cavity modes in perovskites through PEEM, the design of optoelectronic devices based on perovskite microcavities is advanced.
Perovskite microcavities have excellent photophysical properties for integrated optoelectronic devices, such as nanolasers. Imaging and controlling the photonic modes within the cavity are fundamentally important to understand and develop applications. Here, photoemission electron microscopy (PEEM) is used to image the photonic modes within optical microcavities with a nanometer-scale spatial resolution. From a CsPbBr3 microcavity, hybrid mode patterns are observed. Spatial frequency spectrum analysis on the patterns uncovers the characteristic cavity modes, which are modeled with transverse magnetic (TM) and transverse electric (TE) waves, and assigned to exciton-polariton modes. Based on this understanding, the light focus in a designed microcavity is imaged in real space and controlled by the light field polarization. The study confirms that the cavity modes in perovskites can be effectively observed by the PEEM technique under resonant excitation, which, in turn, promotes the design of optoelectronic devices based on perovskite microcavities.
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