Journal
ADVANCED MATERIALS
Volume 33, Issue 17, Pages -Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.202006993
Keywords
adsorption; metal– organic frameworks; porosimetry; porous materials; positron annihilation lifetime spectroscopy; thin films
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Funding
- Research Foundation Flanders (FWO) [G85720N, G0E6319N, G0H0716N, G083016N, 1501618N, 1S53316N, 1S00917N, 12L5417N]
- European Union [801464, 2020 FETOPEN-1-2016-2017]
- European Research Council (ERC) under the European Union's Horizon 2020 research and innovation program [716472]
- KU Leuven [C32/18/056]
- German BMBF project [05K16WN1-Positec]
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Thin films of crystalline and porous metal-organic frameworks (MOFs) have great potential in various applications, but characterizing their pore size, volume, and surface area can be challenging. Positron annihilation lifetime spectroscopy (PALS) is introduced as a powerful method to obtain pore size information in MOF films, complementing existing physisorption-based techniques.
Thin films of crystalline and porous metal-organic frameworks (MOFs) have great potential in membranes, sensors, and microelectronic chips. While the morphology and crystallinity of MOF films can be evaluated using widely available techniques, characterizing their pore size, pore volume, and specific surface area is challenging due to the low amount of material and substrate effects. Positron annihilation lifetime spectroscopy (PALS) is introduced as a powerful method to obtain pore size information and depth profiling in MOF films. The complementarity of this approach to established physisorption-based methods such as quartz crystal microbalance (QCM) gravimetry, ellipsometric porosimetry (EP), and Kr physisorption (KrP) is illustrated. This comprehensive discussion on MOF thin film porosimetry is supported by experimental data for thin films of ZIF-8.
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