Ptychographic wavefront characterization for single-particle imaging at x-ray lasers

Awell-characterized wavefront is important for many x-ray free-electron laser (XFEL) experiments, especially for single-particle imaging (SPI), where individual biomolecules randomly sample a nanometer region of highly focused femtosecond pulses. We demonstrate high-resolution multiple-plane wavefront imaging of an ensemble of XFEL pulses, focused by Kirkpatrick-Baez mirrors, based on mixed-state ptychography, an approach letting us infer and reduce experimental sources of instability. From the recovered wavefront profiles, we show that while local photon fluence correction is crucial and possible for SPI, a small diversity of phase tilts likely has no impact. Our detailed characterization will aid interpretation of data from past and future SPI experiments and provides a basis for further improvements to experimental design and reconstruction algorithms. (C) 2021 Optical Society of America under the terms of the (C)SA Open Access Publishing AgreementY

Automated summary

This study demonstrates high-resolution multiple-plane wavefront imaging of XFEL pulses using mixed-state ptychography, providing insights into experimental sources of instability and emphasizing the importance of local photon fluence correction for SPI experiments. The detailed characterization will aid in interpreting data from past and future SPI experiments, and contribute to further improvements in experimental design and reconstruction algorithms.