Related references
Note: Only part of the references are listed.Non-destructive characterization of thin layer resonant tunneling diodes
Razvan Baba et al.
JOURNAL OF APPLIED PHYSICS (2019)
Non-destructive mapping of doping and structural composition of MOVPE-grown high current density resonant tunnelling diodes through photoluminescence spectroscopy
K. J. P. Jacobs et al.
JOURNAL OF CRYSTAL GROWTH (2015)
Operation of resonant-tunneling diodes with strong back injection from the collector at frequencies up to 1.46 THz
Michael Feiginov et al.
APPLIED PHYSICS LETTERS (2014)
Terahertz technologies: present and future
Tadao Nagatsuma
IEICE ELECTRONICS EXPRESS (2011)
Band parameters for III-V compound semiconductors and their alloys
I Vurgaftman et al.
JOURNAL OF APPLIED PHYSICS (2001)