Journal
OPTIK
Volume 228, Issue -, Pages -Publisher
ELSEVIER GMBH
DOI: 10.1016/j.ijleo.2020.166232
Keywords
Boron doping; Monolayer to multilayer graphene; Raman scattering; D-band; D '-band; (G plus D/D plus D ')-band; Different concentrations; The thickness
Categories
Funding
- Natural Science Foundation of People's Republic of China [11504077]
- Hebei Province Natural Science Foundation [A2020201028]
- Postgraduate Innovation Project of Hebei University [hbu2020ss077]
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This study presents a detailed Raman spectroscopy investigation of boron-doped graphene layers and how the properties change with increasing boron content and layer number. The behavior of defect-dependent modes reaches saturation when boron content exceeds 0.48 wt. %, and these modes shift upwards with increasing layer number due to interactions between boron defects in different layers.
Raman spectroscopy has been widely utilized to investigate the properties of graphene materials and defect effects due to external injection. We presented a detailed Raman spectroscopy study of boron-doped single-layer to six-layer graphene with three different concentrations of substitutional boron atoms as similar to 0.16 wt. %,similar to 0.48 wt. %, and similar to 0.76 wt. %. The Raman signatures of G, 2D, and defect-dependent modes were illustrated. The properties of these modes were revealed with enhanced boron contents and increased layer number. The behaviors of defect-dependent modes reached a plateau when boron content was larger than 0.48 wt. % to show the saturation of interaction between boron and carbon atoms. These modes upshifted with increasing layer number because boron defects in diff ;erent layers interacted with each other by the cascade quenching. Our study provides a detailed investigation of how boron doping changed the properties of graphene layers by defect effects. The results will induce great potential for applications in optoelectronic devices.
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