Journal
OPTICS AND LASER TECHNOLOGY
Volume 134, Issue -, Pages -Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.optlastec.2020.106625
Keywords
Structure; Thin films, Raman; XPS; Optical properties; IR-photodiode
Categories
Funding
- Deanship of Scientific Research (DSR) at the King Abdulaziz University, Jeddah [RG-65-130-41]
- DSR
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Highly crystalline In1-xHfxP ceramic films were synthesized for selective detection of infrared light, with Hf dopant impacting the structure and characteristics of the films. The inclusion of Hf led to decreased bandgap, increased optical conductivity and the development of a photodiode with high sensitivity and stability for infrared detection.
For the first time, highly crystalline In1-xHfxP ceramic films (0 <= x <= 0.09) were synthesized via a sol-gel spin coating technique assisted with 2,3-di(tetradecanoyloxy)propyl tetradecanoate for the selective detection of infrared light. The impact of the Hf dopant on the structure and topographical characteristics of the InP films was studied using X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), and FTIR spectroscopy. As-synthesized In1-xHfxP ceramic films possess a cubic structure, in which Hf atoms replace In atoms in the InP crystals. The Raman spectra of In1-xHfxP ceramic films showed two sharp bands at 302 cm(-1) and 344 cm(-1) as a result of the first-order TO and LO phonon scattering, whereas two weak bands centered at 649 cm(-1) and 691 cm(-1) were assigned to the second-order 2TO and 2LO phonon scattering. The XPS spectra revealed that Hf4f occupied the In3d cites in the InP crystals. These films exhibited high optical absorption, good transparency and low reflectance. The inclusion of the Hf dopant in the InP films instigated a decrease of the bandgap from 1.62 eV to 1.44 eV and caused an increase of the optical conductivity and dissipation factor. A photodiode made of the In0.91Hf0.09P film was constructed. This photo-diode could detect the infrared light with a response time of 1.3 s and a recovery time of 0.9 s. It also exhibited sensitivity of 0.36 mA/W.cm(2) and showed high stability and reproducibility. Therefore, the inclusion of 9 wt% of the Hf dopant in the In cites of the InP crystals may pave the way to the development of highly efficient photodetectors for infrared detection.
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