Zone plate-based full-field transmission X-ray microscopy beamline design at nearly diffraction-limited synchrotron radiation facility

With the development of full-field transmission X-ray microscopy (TXM) for research in biology, life science, material science and physics, zone plate-based full-field TXM is becoming a powerful tool for obtaining quantitative internal structural and chemical information at the nanoscale when combined with spectroscopic imaging. For the TXM beamline design, the best choice is to match the phase space needed by the zone plate from the source point. However, for the nearly diffraction-limited synchrotron radiation sources, it is not easy to fully match the needed phase space due to its low-emittance. Using redshift radiation from an undulator, under consideration of experimental requirements and the heat load effect, this paper describes the design of TXM beamline at the nearly diffraction-limited High Energy Photon Source (HEPS). In this design, not only sufficient illumination angle can be acquired, but also a nearly annular illumination can be obtained to match the illumination required for zone plate imaging. Furthermore, about two times photon flux can be obtained at source point and the photons can be fully used in this design using redshift undulator radiation. The presented design can also be informative for the same kind of beamline design at other nearly diffraction-limited synchrotron photon sources.

Automated summary

Full-field transmission X-ray microscopy (TXM) combined with spectroscopic imaging has become an effective tool for obtaining quantitative nanoscale internal structural and chemical information. The design of TXM beamline at nearly diffraction-limited synchrotron radiation sources using redshift radiation can provide sufficient illumination angle and match the required illumination.