Regulating the interface defect of TiO2/Ag2O nanoheterojunction and its effect on photogenerated carrier dynamics

In this paper, the defects of TiO2/Ag2O nanoheterojunctions are regulated to evaluate the effect of the interface defects on carrier trapping and recombination dynamics by time-resolved photoluminescence spectroscopy (TRPL) and time-resolved terahertz (THZ) spectroscopy. TRPL spectra reveal that interface defects can act as a recombination center and have an accelerative effect on the recombination process of photogenerated carriers under ultraviolet light. Moreover, THZ spectroscopy results demonstrate that interface defects can effectively trap electrons and expedite the Auger recombination. Furthermore, the influence of interface defects on the photocarrier dynamics of TiO2/Ag2O nanoheterojunctions was comprehensively analyzed, providing a valuable experimental reference for the regulation and application of interface defect-fabricated nanoheterojunctions.

Automated summary

In this study, the defects of TiO2/Ag2O nanoheterojunctions were regulated to assess their impact on carrier trapping and recombination dynamics using TRPL and THZ spectroscopy. The findings suggest that interface defects can accelerate carrier recombination and promote electron trapping and Auger recombination in the nanoheterojunctions. This comprehensive analysis provides valuable experimental insights for controlling and utilizing nanoheterojunctions with interface defect fabrication.