Journal
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY
Volume 32, Issue 7, Pages 1648-1658Publisher
AMER CHEMICAL SOC
DOI: 10.1021/jasms.0c00311
Keywords
soft landing; electrospray ion beam deposition; scanning probe microscopy; cluster; nanoparticle
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The study demonstrates several methods for generating, characterizing, and depositing nanoparticle ion beams in vacuum, with a focus on cluster ion beams generated by ESI of organic salt solutions. The transition from clusters to nanoparticles, and their successful deposition, suggests that ES-IBD can handle heavy and highly charged nanoparticles in principle. However, the reproducibility of nanoparticle deposition from dispersions is low due to the lack of control by mass spectrometry.
Electrospray ion beam deposition (ES-IBD) or ion soft landing has been demonstrated as a technique suitable for processing nonvolatile molecules in vacuum under perfectly controlled conditions, an approach also desirable for the deposition of nanoparticles. Here, we present results from several approaches to generate, characterize, and deposit nanoparticle ion beams in vacuum for deposition. We focus on cluster ion beams generated by ESI of organic salt solutions. Small cluster ions of the salts appear in the mass spectra as defined peaks. In addition, we find nanoparticle-sized aggregates, appearing as a low intensity background at high m/z-ratio, and show by IBD experiments that these clusters carry the major amount of material in the ion beam. This transition from clusters to nanoparticles, and their successful deposition, shows that ES-IBD can in principle handle ion beams of very heavy and highly charged nanoparticles. In related experiments, however, we found the deposition of nanoparticles from dispersions to be of low reproducibility, due to the lack of control by mass spectrometry.
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