4.4 Article

Suppressing the lateral growth during HVPE-GaN crystallization in the c-direction

Journal

JOURNAL OF CRYSTAL GROWTH
Volume 556, Issue -, Pages -

Publisher

ELSEVIER
DOI: 10.1016/j.jcrysgro.2020.125986

Keywords

Computer simulation; Growth from vapor; Chloride vapor phase epitaxy; Vapor phase epitaxy; Nitrides; Semiconducting III-V materials

Funding

  1. Polish National Science Center [2018/29/B/ST5/00338]
  2. TEAM TECH program of the Foundation for Polish Science
  3. European Union under the European Regional Development Fund [POIR.04.04.00-00-5CEB/17-00]

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Different configurations of the growth zone were explored for the crystallization of HVPE-GaN in order to suppress lateral growth along the edges. Placing molybdenum elements near the growing crystal proved effective in reducing the area of material deposition at the edges, as confirmed by Computational Fluid Dynamics simulations. This solution was found to result in lower supersaturation values near the crystal edges where the molybdenum elements were placed.
Different configurations of the growth zone were examined for crystallization of HVPE-GaN. The motivation for this work was to suppress growth in the lateral directions which appears on the seed edges during crystallization in the [0 0 0 1] direction. This phenomenon is a significant problem for growing thick GaN boules. Changes in the configuration involved placing molybdenum elements close to the growing crystal. Such a solution allowed to decrease the area of material deposited at the edges. The reason for this was examined with Computational Fluid Dynamics simulations. Distributions of reagents over the seed and the resulting supersaturation were examined. The value of the latter was lower near the edges of the crystal where the molybdenum elements were placed.

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