Journal
INTERNATIONAL JOURNAL OF FATIGUE
Volume 148, Issue -, Pages -Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.ijfatigue.2021.106220
Keywords
Dielectric elastomer; Low-cycle fatigue; Ratchetting; Electro-mechanical coupling; Configurational stress
Funding
- National Natural Science Foundation [11972312]
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Dielectric elastomers (DEs) often experience fatigue failure during electro-mechanical cyclic loading, with the fatigue life significantly influenced by stress levels. A fatigue failure model was developed to predict the low-cycle electro-mechanical fatigue life of DEs, guiding the safe design and evaluation of DE-based devices.
Dielectric elastomers (DEs) often suffer from fatigue failure during electro-mechanical cyclic loading, which significantly constrains the applications of DE-based devices. In this work, we first carried out a series of electromechanical fatigue tests, where the pure-shear DE specimen was loaded with a constant voltage and cyclic stress with various stress levels. It was found that the DE under large cyclic deformation is vulnerable to the low-cycle fatigue in the failure mode of electric breakdown, and the fatigue life is significantly affected by the applied stress amplitudes and mean stresses. An electro-mechanical fatigue failure model was then developed to predict the low-cycle electro-mechanical fatigue life of DEs in a pure-shear cyclic loading mode by using a configurational stress-based damage predictor and an electro-mechanically coupled constitutive model. This work is expected to help guide the safe design and evaluation of DE-based devices.
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