Zinc Oxide Defect Microstructure and Surface Chemistry Derived from Oxidation of Metallic Zinc. Thin Film Transistor and Sensoric Behaviour of ZnO Films and Rods

Invited for the cover of this issue is Jorg J. Schneider and co-workers at Technical University Darmstadt, Helmholtz-Zentrum Dresden-Rossendorf and KIT Karlsruhe. The image depicts the application of high energy generated electron/positron couples which are able to detect defects sites in semiconducting zinc oxide thin films. Read the full text of the article at 10.1002/chem.202004270.

Automated summary

The cover of this issue features Jorg J. Schneider and colleagues from Technical University Darmstadt, Helmholtz-Zentrum Dresden-Rossendorf, and KIT Karlsruhe showcasing the application of high energy electron/positron couples to detect defect sites in semiconducting zinc oxide thin films.