Electrical properties characterization of single yeast cells by dielectrophoretic motion and electro-rotation

The electrical parameters of single cells are label-free and intrinsic properties that can reflect the physiological characteristics. In recent years, many measurement methods based on impedance spectroscopy and rotation spectrum analysis have been developed. However, most of these works need to measure the response at whole frequency range to obtain DEP spectra and estimate the electrical parameters by fitting method, which are time-consuming and limit the measurement throughput. Therefore, improving the measurement throughput for single cells is an essential problem to be solved addressed. In this paper we present a microfluidic chip that combines dielectrophoretic motion and electro-rotation technology for single-cell electrical properties characterization. Since the movement and rotation speed of single cell in mediums are related to the electrical parameters of itself, electric signals and medium, the electrical properties can be obtained by measuring and analyzing the movement trajectory and rotation speed of the cell. Numerical simulations were performed to analyze the electric field distribution of the chip under different signal configurations, which predict the movement trajectory and rotation state, and determine the values of electric field on the cells. Based on the simulation results, cell focusing, dielectrophoretic motion and electro-rotation were successfully realized. By analyzing the movement trajectory and rotation speed, the conductivity of wall and the permittivity of membrane of yeast cells were characterized. The measurement method avoids the time-consuming of the traditional rotational spectra method, and can realize rapid and efficiency and single-cell electrical characterization.

Automated summary

This study presents a microfluidic chip that combines dielectrophoretic motion and electro-rotation technology for single-cell electrical properties characterization. The electrical properties of yeast cells were successfully characterized by analyzing the movement trajectory and rotation speed. This measurement method avoids the time-consuming traditional rotational spectra method, and achieves rapid and efficient single-cell electrical characterization.