Journal
APPLIED PHYSICS LETTERS
Volume 118, Issue 9, Pages -Publisher
AIP Publishing
DOI: 10.1063/5.0037765
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Funding
- U.S. Department of Energy, Office of Basic Sciences, Division of Materials Sciences and Engineering [DE-SC0002334]
- Defense Advanced Research Projects Agency (DARPA)
- U.S. Army Aviation and Missile Research, Development, and Engineering Center (AMRDEC) [W31P4Q-08-1-0012.47]
- UCLA Center for Functional Engineered and Nano Architectonics
- National Science Foundation [NNCI-2025233, OAC-1919789]
- NSF MRSEC program [DMR-1719875]
- High Performance Computing Center at Missouri University of Science and Technology
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In this study, the thermal conductivity of (SrTiO3)(n)SrO Ruddlesden-Popper superlattice thin films with different numbers of layers was measured, revealing a decrease in thermal conductivity with increasing interface density. Characterization by X-ray diffraction and scanning transmission electron microscopy confirmed the Ruddlesden-Popper superlattice structure of the samples.
Unlike many superlattice structures, Ruddlesden-Popper phases have atomically abrupt interfaces useful for interrogating how periodic atomic layers affect thermal properties. Here, we measure the thermal conductivity in thin films of the n=1-5 and 10 members of the (SrTiO3)(n)SrO Ruddlesden-Popper superlattices grown by molecular-beam epitaxy and compare the results to a single crystal of the n=1 Ruddlesden-Popper SrLaAlO4. The thermal conductivity cross-plane to the superlattice layering (k(33)) is measured using time-domain thermoreflectance as a function of temperature and the results are compared to first-principles calculations. The thermal conductivity of this homologous series decreases with increasing interface density. Characterization by x-ray diffraction and scanning transmission electron microscopy confirms that these samples have a Ruddlesden-Popper superlattice structure.
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