4.8 Article

X-ray Diffraction Computed Nanotomography Applied to Solve the Structure of Hierarchically Phase-Separated Metallic Glass

Journal

ACS NANO
Volume 15, Issue 2, Pages 2386-2398

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsnano.0c04851

Keywords

X-ray diffraction; computed nanotomography; metallic glass; heterogeneous system; hierarchically phase-separated; nanoscale

Funding

  1. ESRF, France
  2. ETH+ initiative within the framework of SynMatLab (Laboratory for Multiscale Materials Synthesis and Hands-On Education)
  3. European Research Council through the Advanced Grant INTELHYB - Next Generation of Complex Metallic Materials in Intelligent Hybrid Structures [ERC-2013-ADG-340025]
  4. European Union [659226]
  5. National Research Foundation of Korea (NRF), Korean Government (MSIT) [NRF-2020R1F1A1076636]
  6. Marie Curie Actions (MSCA) [659226] Funding Source: Marie Curie Actions (MSCA)

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The study demonstrates that X-ray diffraction computed nanotomography can provide accurate details of the internal structure of metallic glasses, which is of great significance for the research of metallic materials at the nanoscale.
The structure of matter at the nanoscale, in particular that of amorphous metallic alloys, is of vital importance for functionalization. With the availability of synchrotron radiation, it is now possible to visualize the internal features of metallic samples without physically destroying them. Methods based on computed tomography have recently been employed to explore the local features. Tomographic reconstruction, while it is relatively uncomplicated for crystalline materials, may generate undesired artifacts when applied to featureless amorphous or nanostructured metallic alloys. In this study we show that X-ray diffraction computed nanotomography can provide accurate details of the internal structure of a metallic glass. We demonstrate the power of the method by applying it to a hierarchically phase- separated amorphous sample with a small volume fraction of crystalline inclusions, focusing the X-ray beam to 500 nm and ensuring a submicrometer 2D resolution via the number of scans.

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