4.8 Article

Neural Network-Based On-Chip Spectroscopy Using a Scalable Plasmonic Encoder

Journal

ACS NANO
Volume 15, Issue 4, Pages 6305-6315

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsnano.1c00079

Keywords

computational spectroscopy; on-chip spectroscopy; plasmonics; neural networks; deep learning

Funding

  1. National Science Foundation (NSF) PATHS-UP
  2. Howard Hughes Medical Institute (HHMI)
  3. NSF graduate research fellowship

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This study demonstrates a deep learning-based spectral reconstruction framework using a compact and low-cost on-chip sensing scheme that overcomes the limitations set by size, cost, signal-to-noise ratio, and spectral resolution in conventional spectrometers. The system accurately reconstructs unknown spectra and is suitable for applications that require cost-effective, portable, and high-resolution spectroscopy tools.
Conventional spectrometers are limited by trade-offs set by size, cost, signal-to-noise ratio (SNR), and spectral resolution. Here, we demonstrate a deep learning-based spectral reconstruction framework using a compact and low-cost on-chip sensing scheme that is not constrained by many of the design trade-offs inherent to grating-based spectroscopy. The system employs a plasmonic spectral encoder chip containing 252 different tiles of nanohole arrays fabricated using a scalable and low-cost imprint lithography method, where each tile has a specific geometry and thus a specific optical transmission spectrum. The illumination spectrum of interest directly impinges upon the plasmonic encoder, and a CMOS image sensor captures the transmitted light without any lenses, gratings, or other optical components in between, making the entire hardware highly compact, lightweight, and field-portable. A trained neural network then reconstructs the unknown spectrum using the transmitted intensity information from the spectral encoder in a feed-forward and noniterative manner. Benefiting from the parallelization of neural networks, the average inference time per spectrum is similar to 28 mu s, which is much faster compared to other computational spectroscopy approaches. When blindly tested on 14 648 unseen spectra with varying complexity, our deep-learning based system identified 96.86% of the spectral peaks with an average peak localization error, bandwidth error, and height error of 0.19 nm, 0.18 nm, and 7.60%, respectively. This system is also highly tolerant to fabrication defects that may arise during the imprint lithography process, which further makes it ideal for applications that demand cost-effective, field-portable, and sensitive high-resolution spectroscopy tools.

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