Related references
Note: Only part of the references are listed.Simultaneous dual-wavelength phase-shifting interferometry for surface topography measurement
Qian Liu et al.
OPTICS AND LASERS IN ENGINEERING (2020)
Compact snapshot dual-mode interferometric system for on-machine measurement
Daodang Wang et al.
OPTICS AND LASERS IN ENGINEERING (2020)
Phase recovery method in digital holographic interferometry using high-resolution signal parameter estimation
Ankur Vishnoi et al.
APPLIED OPTICS (2019)
Rapid deformation analysis in digital holographic interferometry using graphics processing unit accelerated Wigner-Ville distribution
Ankur Vishnoi et al.
APPLIED OPTICS (2019)
On-machine and in-process surface metrology for precision manufacturing
W. Gao et al.
CIRP ANNALS-MANUFACTURING TECHNOLOGY (2019)
On-machine surface measurement and applications for ultra-precision machining: a state-of-the-art review
Duo Li et al.
INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY (2019)
Graphics processing unit assisted diffraction phase microscopy for fast non-destructive metrology
Jagadesh Ramaiah et al.
MEASUREMENT SCIENCE AND TECHNOLOGY (2019)
Step phase reconstruction using an anisotropic total variation regularization method in a diffraction phase microscopy
Allaparthi Venkata Satya Vithin et al.
APPLIED OPTICS (2019)
Spatio-Temporal Adaptive Sampling for effective coverage measurement planning during quality inspection of free form surfaces using robotic 3D optical scanner
Manoj Babu et al.
JOURNAL OF MANUFACTURING SYSTEMS (2019)
Micro deep learning profilometry for high-speed 3D surface imaging
Shijie Feng et al.
OPTICS AND LASERS IN ENGINEERING (2019)
Development and Application of Interferometric On-Machine Surface Measurement for Ultraprecision Turning Process
Duo Li et al.
JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING-TRANSACTIONS OF THE ASME (2019)
Advanced spatial spectrum fitting algorithm for significantly improving the noise resistance ability of self-calibration phase shifting interferometry
Shengqi Cao et al.
OPTICS AND LASERS IN ENGINEERING (2019)
Do we need all the frequency components of a fringe signal to obtain position information in a vertical scanning wideband interferometer?
Dong Wei et al.
OPTICS COMMUNICATIONS (2019)
A profile error evaluation method for freeform surface measured by sweep scanning on CMM
Gaiyun He et al.
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY (2019)
Temporal phase unwrapping using deep learning
Wei Yin et al.
SCIENTIFIC REPORTS (2019)
Fringe pattern analysis using deep learning
Shijie Feng et al.
ADVANCED PHOTONICS (2019)
Phase recovery and holographic image reconstruction using deep learning in neural networks
Yair Rivenson et al.
LIGHT-SCIENCE & APPLICATIONS (2018)
Improvement of the fringe analysis algorithm for wavelength scanning interferometry based on filter parameter optimization
Tao Zhang et al.
APPLIED OPTICS (2018)
An improved adaptive sampling strategy for freeform surface inspection on CMM
Gaiyun He et al.
INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY (2018)
Calibration of an interferometric on-machine probing system on an ultra-precision turning machine
Duo Li et al.
MEASUREMENT (2018)
Correction of phase-shifting error in wavelength scanning digital holographic microscopy
Xiaolei Zhang et al.
MEASUREMENT SCIENCE AND TECHNOLOGY (2018)
Phase shifting algorithms for fringe projection profilometry: A review
Chao Zuo et al.
OPTICS AND LASERS IN ENGINEERING (2018)
Non-invasive precision metrology using diffraction phase microscopy and space-frequency method
Sreeprasad Ajithaprasad et al.
OPTICS AND LASERS IN ENGINEERING (2018)
A novel dual-wavelength iterative method for generalized dual-wavelength phase-shifting interferometry with second-order harmonics
Xiaoqing Xu et al.
OPTICS AND LASERS IN ENGINEERING (2018)
Advanced Fourier transform analysis method for phase retrieval from a single-shot spatial carrier fringe pattern
Zhichao Dong et al.
OPTICS AND LASERS IN ENGINEERING (2018)
Hilbert-Huang transform based advanced Bessel fringe generation and demodulation for full-field vibration studies of specular reflection micro-objects
Maciej Trusiak et al.
OPTICS AND LASERS IN ENGINEERING (2018)
Parallel computing in experimental mechanics and optical measurement: A review (II)
Tianyi Wang et al.
OPTICS AND LASERS IN ENGINEERING (2018)
Automatic selection of frequency domain filter for interference fringe analysis in pulse-train interferometer
Dong We et al.
OPTICS COMMUNICATIONS (2018)
An accurate phase shift extraction algorithm for phase shifting interferometry
Zhongsheng Zhai et al.
OPTICS COMMUNICATIONS (2018)
Non-contact on-machine measurement using a chromatic confocal probe for an ultra-precision turning machine
Xicong Zou et al.
INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY (2017)
Tomographic flow cytometry by digital holography
Francesco Merola et al.
LIGHT-SCIENCE & APPLICATIONS (2017)
Vibration-insensitive low coherence interferometer (LCI) for the measurement of technical surfaces
Yinan Li et al.
MEASUREMENT (2017)
Intelligent adaptive sampling guided by Gaussian process inference
Yuhang Chen et al.
MEASUREMENT SCIENCE AND TECHNOLOGY (2017)
Application of two-dimensional wavelet transform in the modulation measurement profilometry
Jingjing Huang et al.
OPTICAL ENGINEERING (2017)
3-D surface profilometry based on modulation measurement by applying wavelet transform method
Min Zhong et al.
OPTICS AND LASERS IN ENGINEERING (2017)
Review of surface profile measurement techniques based on optical interferometry
Yunzhi Wang et al.
OPTICS AND LASERS IN ENGINEERING (2017)
3-D surface profile measurement using spectral interferometry based on continuous wavelet transform
Takuma Serizawa et al.
OPTICS COMMUNICATIONS (2017)
Eliminating the influence of source spectrum of white light scanning interferometry through time-delay estimation algorithm
Yunfei Zhou et al.
OPTICS COMMUNICATIONS (2017)
Surface shape measurement by multi-illumination lensless Fourier transform digital holographic interferometry
Jun Dong et al.
OPTICS COMMUNICATIONS (2017)
Self-calibration phase-shifting algorithm with interferograms containing very few fringes based on Fourier domain estimation
Yi Wang et al.
OPTICS EXPRESS (2017)
Surface topography acquisition method for double-sided near-right-angle structured surfaces based on dual-probe wavelength scanning interferometry
Tao Zhang et al.
OPTICS EXPRESS (2017)
Dependant Gaussian processes regression for intelligent sampling of freeform and structured surfaces
Yuehong Yin et al.
CIRP ANNALS-MANUFACTURING TECHNOLOGY (2017)
Adaptive Measurement and Modelling Methodology for In-line 3D Surface Metrology Scanners
Manoj Babu et al.
COMPLEX SYSTEMS ENGINEERING AND DEVELOPMENT (2017)
Laser based additive manufacturing in industry and academia
Michael Schmidt et al.
CIRP ANNALS-MANUFACTURING TECHNOLOGY (2017)
Surface recovery algorithm in white light interferometry based on combined white light phase shifting and fast Fourier transform algorithms
Quangsang Vo et al.
APPLIED OPTICS (2017)
Gaussian process based multi-scale modelling for precision measurement of complex surfaces
Yuehong Yin et al.
CIRP ANNALS-MANUFACTURING TECHNOLOGY (2016)
Robust Detection of Non-Regular Interferometric Fringes From a Self-Mixing Displacement Sensor Using Bi-Wavelet Transform
Olivier D. Bernal et al.
IEEE SENSORS JOURNAL (2016)
Identification and compensation of main machining errors on surface form accuracy in ultra-precision diamond turning
Xianlei Liu et al.
INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE (2016)
A novel surface recovery algorithm in white light interferometry
Zili Lei et al.
MEASUREMENT (2016)
Error-compensating phase-shifting algorithm for surface shape measurement of transparent plate using wavelength-tuning Fizeau interferometer
Yangjin Kim et al.
OPTICS AND LASERS IN ENGINEERING (2016)
Fast fringe pattern phase demodulation using FIR Hilbert transformers
Munther Gdeisat et al.
OPTICS COMMUNICATIONS (2016)
Determination of phase derivatives from a single fringe pattern using Teager Hilbert Huang transform
B. Deepan et al.
OPTICS COMMUNICATIONS (2016)
A novel 3D stitching method for WLI based large range surface topography measurement
Zili Lei et al.
OPTICS COMMUNICATIONS (2016)
Measurement of micro-V-groove dihedral using white light interferometry
Fengzhou Fang et al.
OPTICS COMMUNICATIONS (2016)
Phase and fringe order determination in wavelength scanning interferometry
Giuseppe Moschetti et al.
OPTICS EXPRESS (2016)
Single shot fringe pattern phase demodulation using Hilbert-Huang transform aided by the principal component analysis
Maciej Trusiak et al.
OPTICS EXPRESS (2016)
Quantitative phase imaging by single-shot Hilbert-Huang phase microscopy
Maciej Trusiak et al.
OPTICS LETTERS (2016)
Precise phase retrieval under harsh conditions by constructing new connected interferograms
Jian Deng et al.
SCIENTIFIC REPORTS (2016)
Comparison of envelope detection techniques in coherence scanning interferometry
G. Gianto et al.
APPLIED OPTICS (2016)
A generalized on-line estimation and control of five-axis contouring errors of CNC machine tools
Jixiang Yang et al.
INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE (2015)
Applications of windowed Fourier fringe analysis in optical measurement: A review
Qian Kemao
OPTICS AND LASERS IN ENGINEERING (2015)
Using higher steps phase-shifting algorithms and linear least-squares fitting in white-light scanning interferometry
Ming-Hsing Shen et al.
OPTICS AND LASERS IN ENGINEERING (2015)
Compensation strategy for machining optical freeform surfaces by the combined on- and off-machine measurement
Xiaodong Zhang et al.
OPTICS EXPRESS (2015)
Principles of interference microscopy for the measurement of surface topography
Peter de Groot
ADVANCES IN OPTICS AND PHOTONICS (2015)
Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction
A. Leong-Hoi et al.
VIDEOMETRICS, RANGE IMAGING, AND APPLICATIONS XIII (2015)
Surface topography measurement based on color images processing in white light interferometry
Tong Guo et al.
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION IX (2015)
Real-time microscopic phase-shifting profilometry
Sam Van der Jeught et al.
APPLIED OPTICS (2015)
Measurement of surface roughness of thin films by a hybrid interference microscope with different phase algorithms
Chuen-Lin Tien et al.
APPLIED OPTICS (2014)
Correlated errors in phase-shifting laser Fizeau interferometry
Peter J. de Groot
APPLIED OPTICS (2014)
Advanced processing of optical fringe patterns by automated selective reconstruction and enhanced fast empirical mode decomposition
Maciej Trusiak et al.
OPTICS AND LASERS IN ENGINEERING (2014)
Heterodyne moire interferometry for measuring corneal surface profile
Wei-Yao Chang et al.
OPTICS AND LASERS IN ENGINEERING (2014)
Nanoscale topography and spatial light modulator characterization using wide-field quantitative phase imaging
Gannavarpu Rajshekhar et al.
OPTICS EXPRESS (2014)
3D surface mapping of freeform optics using wavelength scanning lateral shearing interferometry
Young-Sik Ghim et al.
OPTICS EXPRESS (2014)
Interferometric measurement of a concave, phi-polynomial, Zernike mirror
Kyle Fuerschbach et al.
OPTICS LETTERS (2014)
Precision evaluation of surface form error of a large-scale roll workpiece on a drum roll lathe
Jung Chul Lee et al.
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY (2014)
Center Wavelength Measurement Based on Higher Steps Phase-Shifting Algorithms in White-Light Scanning Interferometry
Ming-Hsing Shen et al.
37TH NATIONAL CONFERENCE ON THEORETICAL AND APPLIED MECHANICS (37TH NCTAM 2013) & THE 1ST INTERNATIONAL CONFERENCE ON MECHANICS (1ST ICM) (2014)
Vibration insensitive extended range interference microscopy
Joshua T. Wiersma et al.
APPLIED OPTICS (2013)
Manufacturing and measurement of freeform optics
F. Z. Fang et al.
CIRP ANNALS-MANUFACTURING TECHNOLOGY (2013)
Precision tool setting for fabrication of a microstructure array
Wei Gao et al.
CIRP ANNALS-MANUFACTURING TECHNOLOGY (2013)
Detecting 20 nm Wide Defects in Large Area Nanopatterns Using Optical Interferometric Microscopy
Renjie Zhou et al.
NANO LETTERS (2013)
Phase estimation using a state-space approach based method
Gannavarpu Rajshekhar et al.
OPTICS AND LASERS IN ENGINEERING (2013)
Hilbert-Huang processing for single-exposure two-dimensional grating interferometry
Maciej Trusiak et al.
OPTICS EXPRESS (2013)
Multiple signal classification technique for phase estimation from a fringe pattern
Gannavarpu Rajshekhar et al.
APPLIED OPTICS (2012)
Comparison study of algorithms and accuracy in the wavelength scanning interferometry
Hussam Muhamedsalih et al.
APPLIED OPTICS (2012)
Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase calculation at discontinuities in fringe projection profilometry
Zonghua Zhang et al.
OPTICS AND LASERS IN ENGINEERING (2012)
Interference fringe analysis based on recurrence computational algorithms
Igor Gurov et al.
OPTICS AND LASERS IN ENGINEERING (2012)
White-light interferometry-Envelope detection by Hilbert transform and influence of noise
Pavel Pavlicek et al.
OPTICS AND LASERS IN ENGINEERING (2012)
White light interferometry for surface profiling with a colour CCD
U. Paul Kumar et al.
OPTICS AND LASERS IN ENGINEERING (2012)
Parallel computing in experimental mechanics and optical measurement: A review
Wenjing Gao et al.
OPTICS AND LASERS IN ENGINEERING (2012)
Surface and thickness measurement of a transparent film using wavelength scanning interferometry
Feng Gao et al.
OPTICS EXPRESS (2012)
Fringe demodulation using the two-dimensional phase differencing operator
Gannavarpu Rajshekhar et al.
OPTICS LETTERS (2012)
High-resolution, real-time 3D imaging with fringe analysis
Nikolaus Karpinsky et al.
JOURNAL OF REAL-TIME IMAGE PROCESSING (2012)
Review on diamond-machining processes for the generation of functional surface structures
Ekkard Brinksmeier et al.
CIRP JOURNAL OF MANUFACTURING SCIENCE AND TECHNOLOGY (2012)
Plasma assisted polishing of single crystal SiC for obtaining atomically flat strain-free surface
K. Yamamura et al.
CIRP ANNALS-MANUFACTURING TECHNOLOGY (2011)
In situ real-time measurement for micro-structured surfaces
X. Jiang
CIRP ANNALS-MANUFACTURING TECHNOLOGY (2011)
Application of least-square estimation in white-light scanning interferometry
S. Ma et al.
OPTICS AND LASERS IN ENGINEERING (2011)
Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry
S. Ma et al.
OPTICS COMMUNICATIONS (2011)
Blind self-calibrating algorithm for phase-shifting interferometry by use of cross-bispectrum
Hongwei Guo
OPTICS EXPRESS (2011)
Heterodyne interferometer scheme using a double pass in an acousto-optic modulator
Youngkyu Park et al.
OPTICS LETTERS (2011)
Two-wavelength in-line phase-shifting interferometry based on polarizing separation for accurate surface profiling
D. G. Abdelsalam et al.
APPLIED OPTICS (2011)
Chemo-mechanical magneto-rheological finishing (CMMRF) of silicon for microelectronics applications
V. K. Jain et al.
CIRP ANNALS-MANUFACTURING TECHNOLOGY (2010)
Precision engineering for astronomy and gravity science
P. Shore et al.
CIRP ANNALS-MANUFACTURING TECHNOLOGY (2010)
Wavelet ridge techniques in optical fringe pattern analysis
Sikun Li et al.
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION (2010)
Recent progresses on real-time 3D shape measurement using digital fringe projection techniques
Song Zhang
OPTICS AND LASERS IN ENGINEERING (2010)
Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry
Lei Huang et al.
OPTICS AND LASERS IN ENGINEERING (2010)
Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise
Xiangqian Jiang et al.
APPLIED OPTICS (2010)
In-line digital holography for dynamic metrology of MEMS
Vijay Raj Singh et al.
CHINESE OPTICS LETTERS (2009)
Self-patterning of a polydimethylsiloxane microlens array on functionalized substrates and characterization by digital holography
F. Merola et al.
JOURNAL OF MICROMECHANICS AND MICROENGINEERING (2009)
Measurement of discontinuous surfaces using multiple-wavelength interferometry
Paul Kumar Upputuri et al.
OPTICAL ENGINEERING (2009)
Two-wavelength micro-interferometry for 3-D surface profiling
U. Paul Kumar et al.
OPTICS AND LASERS IN ENGINEERING (2009)
Real-time 2D parallel windowed Fourier transform for fringe pattern analysis using Graphics Processing Unit
Wenjing Gao et al.
OPTICS EXPRESS (2009)
Phase-shift extraction for generalized phase-shifting interferometry
Peng Gao et al.
OPTICS LETTERS (2009)
Optical tomography for biomedical applications by digital interference holography
M. C. Potcoava et al.
MEASUREMENT SCIENCE AND TECHNOLOGY (2008)
Continuous wavelet transform for micro-component profile measurement using vertical scanning interferometry
M. Li et al.
OPTICS AND LASER TECHNOLOGY (2008)
New algorithm of white-light phase shifting interferometry pursing higher repeatability by using numerical phase error correction schemes of pre-processor, main processor, and post-processor
Jung-Hwan Kim et al.
OPTICS AND LASERS IN ENGINEERING (2008)
Windowed Fourier transform for fringe pattern analysis: theoretical analyses
Qian Kemao et al.
APPLIED OPTICS (2008)
Experimental study of the phase-shift miscalibration error in phase-shifting interferometry: use of a spectrally resolved white-light interferometer
Sanjit K. Debnath et al.
APPLIED OPTICS (2007)
LED-based multi-wavelength phase imaging interference microscopy
N. Warnasooriya et al.
OPTICS EXPRESS (2007)
Surface profile measurement of a sinusoidal grid using an atomic force microscope on a diamond turning machine
Wei Gao et al.
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY (2007)
Scanning holographic microscopy with resolution exceeding the Rayleigh limit of the objective by superposition of off-axis holograms
Guy Indebetouw et al.
APPLIED OPTICS (2007)
Advanced iterative algorithm for randomly phase-shifted interferograms with intra- and inter-frame intensity variations
Zhaoyang Wang et al.
OPTICS AND LASERS IN ENGINEERING (2007)
Increase of maximum detectable slope with optical profilers, through controlled tilting and image processing
F. Marinello et al.
MEASUREMENT SCIENCE AND TECHNOLOGY (2007)
Two-dimensional windowed Fourier transform for fringe pattern analysis: Principles, applications and implementations
Qian Kemao
OPTICS AND LASERS IN ENGINEERING (2007)
Blind phase shift estimation in phase-shifting interferometry
Hongwei Guo et al.
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION (2007)
Comparison of optical and stylus methods for measurement of surface texture
T. V. Vorburger et al.
INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY (2007)
Metrology of freeform shaped parts
E. Savio et al.
CIRP ANNALS-MANUFACTURING TECHNOLOGY (2007)
Near common-path optical fiber interferometer for potentially fast on-line microscale-nanoscale surface measurement
Xiangqian Jiang et al.
OPTICS LETTERS (2006)
Two-wavelength interferometric profilometry with a phase-step error-compensating algorithm
Joanna Schmit et al.
OPTICAL ENGINEERING (2006)
On-machine measurement of a cylindrical surface with sinusoidal micro-structures by an optical slope sensor
Wei Gao et al.
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY (2006)
Manufacturing and measurement of the MIRI spectrometer optics for the James Webb Space Telescope
P. Shore et al.
CIRP ANNALS-MANUFACTURING TECHNOLOGY (2006)
Phase retrieval of optical fringe patterns from the ridge of a wavelet transform
JG Zhong et al.
OPTICS LETTERS (2005)
Isoparametric line sampling for the inspection planning of sculptured surfaces
DF ElKott et al.
COMPUTER-AIDED DESIGN (2005)
Interferometric phase-measurement using a one-dimensional discrete Hilbert transform
R Onodera et al.
OPTICAL REVIEW (2005)
Simultaneous digital correction of amplitude and phase errors of retrieved wave-front in phase-shifting interferometry with arbitrary phase shift errors
LZ Cai et al.
OPTICS COMMUNICATIONS (2004)
A digital holographic microscope for complete characterization of microelectromechanical systems
G Coppola et al.
MEASUREMENT SCIENCE AND TECHNOLOGY (2004)
Signal modeling for low-coherence height-scanning interference microscopy
P de Groot et al.
APPLIED OPTICS (2004)
Advanced iterative algorithm for phase extraction of randomly phase-shifted interferograms
ZY Wang et al.
OPTICS LETTERS (2004)
Phase-shift extraction and wave-front reconstruction in phase-shifting interferometry with arbitrary phase steps
LZ Cai et al.
OPTICS LETTERS (2003)
Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry-application to absolute long gauge block measurement
JE Decker et al.
APPLIED OPTICS (2003)
Accuracy enhancement of five-axis CNC machines through real-time error compensation
WT Lei et al.
INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE (2003)
Red-green-blue interferometer for the metrology of discontinuous structures
A Pförtner et al.
APPLIED OPTICS (2003)
Determination of fringe order in white-light interference microscopy
P de Groot et al.
APPLIED OPTICS (2002)
Profilometry of sloped plane surfaces by wavelength scanning interferometry
A Yamamoto et al.
OPTICAL REVIEW (2002)
2π ambiguity-free optical distance measurement with subnanometer precision with a novel phase-crossing low-coherence interferometer
CH Yang et al.
OPTICS LETTERS (2002)
Real-time phase-resolved functional optical coherence tomography by use of optical Hilbert transformation
YH Zhao et al.
OPTICS LETTERS (2002)
A self-calibrating phase-shifting algorithm based on the natural demodulation of two-dimensional fringe patterns
KG Larkin
OPTICS EXPRESS (2001)
Phase-sensitive frequency-multiplexed optical low-coherence reflectometery
DP Davé et al.
OPTICS COMMUNICATIONS (2001)
Practical common-path heterodyne surface profiling interferometer with automatic focusing
HZ Zhao et al.
OPTICS AND LASER TECHNOLOGY (2001)
Fourier transform profilometry: a review
XY Su et al.
OPTICS AND LASERS IN ENGINEERING (2001)
Integer ambiguity resolution in phase closure imaging
A Lannes
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION (2001)
High-sensitivity surface-profile measurements by heterodyne white-light interferometer
A Hirai et al.
OPTICAL ENGINEERING (2001)
Surface shape measurement by wavelength scanning interferometry using an electronically tuned Ti : sapphire laser
A Yamamoto et al.
OPTICAL REVIEW (2001)
Surface profilometry by wavelength scanning Fizeau interferometer
A Yamamoto et al.
OPTICS AND LASER TECHNOLOGY (2000)
Fringe modulation skewing effect in white-light vertical scanning interferometry
A Harasaki et al.
APPLIED OPTICS (2000)
Phase-shifting interferometry: minimization of systematic errors
P Hariharan
OPTICAL ENGINEERING (2000)
Surface topography by wavelength scanning interferometry
I Yamaguchi et al.
OPTICAL ENGINEERING (2000)
Share Paper
