4.6 Article

Organic Hole Transport Material Ionization Potential Dictates Diffusion Kinetics of Iodine Species in Halide Perovskite Devices

Journal

ACS ENERGY LETTERS
Volume 6, Issue 2, Pages 501-508

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsenergylett.0c02495

Keywords

-

Funding

  1. ExxonMobil
  2. DARPA Award [N66001-20-1-4052]
  3. Princeton Center for Complex Materials, a National Science Foundation (NSF)-MRSEC program [DMR-1420541]
  4. U.S. Department of Energy (DOE) [DE-AC36-08GO28308]
  5. U.S. DOE, Office of Energy Efficiency and Renewable Energy, Solar Energy Technologies Office

Ask authors/readers for more resources

Iodine-containing volatiles are major degradation products of halide perovskite materials under irradiation. The study examines the diffusion kinetics of iodine into organic hole transport materials (HTMs) and reactions, finding a correlation between I-2 permeability and HTM ionization energy. This suggests that HTM energetics influence the stability of halide perovskite devices by suppressing iodine migration.
Iodine-containing volatiles are major degradation products of halide perovskite materials under irradiation, yet iodine diffusion kinetics into and throughout organic hole transport materials (HTMs) and consequent reactions are largely unexplored. Here, we modify the Ca:O-2 corrosion test to Ag:I-2 to quantify I-2 transmission rates through common organic HTMs. We observe I-2 permeability to inversely correlate with HTM ionization energy, or the highest occupied molecular orbital (HOMO) energy. Tracking electronic conductance during exposure to I-2 confirms shallow HOMO HTMs are strongly oxidized (i.e., doped), leading to substantial I-2 uptake and increased transmission rates. Finally, relationships between HOMO level, doping, and transmission rate are maintained when methylammonium lead triiodide (MAPbI(3)) photolysis products are the only source of iodine. While HTM energetics influence the initial performance of halide perovskite devices by selective charge extraction, our results further suggest they will affect device stability; deeper HOMO energy HTMs will suppress iodine migration and associated degradation mechanisms.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available