Journal
COATINGS
Volume 10, Issue 12, Pages -Publisher
MDPI
DOI: 10.3390/coatings10121211
Keywords
thickness determination; thin film; material characterization; metal coating; cross-section; optical microscopy; scanning electron microscope (SEM); focused ion beam (FIB); energy-dispersive X-ray spectroscopy (EDS); X-ray fluorescence spectroscopy (XRF)
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Funding
- PRIN (Progetti di Ricerca di Rilevante Interesse Nazionale) [2017YH9MRK]
- Ente Cassa di Risparmio di Firenze [2013.0878]
- Regione Toscana POR FESR 2014-2020 [6455]
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Thickness dramatically affects the functionality of coatings. Accordingly, the techniques in use to determine the thickness are of utmost importance for coatings research and technology. In this review, we analyse some of the most appropriate methods for determining the thickness of metallic coatings. In doing so, we classify the techniques into two categories: (i) destructive and (ii) non-destructive. We report on the peculiarity and accuracy of each of these methods with a focus on the pros and cons. The manuscript also covers practical issues, such as the complexity of the procedure and the time required to obtain results. While the analysis focuses most on metal coatings, many methods are also applicable to films of other materials.
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