Journal
CRYSTALS
Volume 10, Issue 12, Pages -Publisher
MDPI
DOI: 10.3390/cryst10121109
Keywords
X-ray photon correlation spectroscopy; X-ray free electron laser; speckle visibility; X-ray intensity fluctuations
Funding
- U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Science and Engineering Division
- U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-AC02-06CH11357]
- Natural Sciences and Engineering Research Council of Canada (NSERC) [RGPIN-2017-06915]
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How materials evolve at thermal equilibrium and under external excitations at small length and time scales is crucial to the understanding and control of material properties. X-ray photon correlation spectroscopy (XPCS) at X-ray free electron laser (XFEL) facilities can in principle capture dynamics of materials that are substantially faster than a millisecond. However, the analysis and interpretation of XPCS data is hindered by the strongly fluctuating X-ray intensity from XFELs. Here we examine the impact of pulse-to-pulse intensity fluctuations on sequential XPCS analysis. We show that the conventional XPCS analysis can still faithfully capture the characteristic time scales, but with substantial decrease in the signal-to-noise ratio of the g2 function and increase in the uncertainties of the extracted time constants. We also demonstrate protocols for improving the signal-to-noise ratio and reducing the uncertainties.
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