4.6 Article

Characterization of a 2D Electron Gas at the Interface of Atomic-Layer Deposited Al2O3/ZnO Thin Films for a Field-Effect Transistor

Rate this paper

The primary rating indicates the level of overall quality for the paper. Secondary ratings independently reflect strengths or weaknesses of the paper.

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started