Journal
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY
Volume 10, Issue 12, Pages 1989-1995Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TCPMT.2020.3034213
Keywords
Ag-alloy bonding wires; Ag ion migration; anodic dissolution rates; ion migration rates
Categories
Funding
- Industrial and Academic Cooperation Programs of Wire Technology Company Ltd.
- Ministry of Science and Technology, Taiwan [MOST 108-2622-E002-009-CC2]
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The bondability and reliability of Ag-5Pd-3.5Au alloy wire was verified previously for application in light-emitting diode (LED) packages. This Ag-alloy bonding wire has an electrical resistivity of 4.6 mu Omega.cm, lower than those of the ternary Ag-3Pd-20Au (8.6 mu Omega.cm) and Ag-3Pd-8Au wires (5.0 mu Omega.cm). Further evaluation of the resistance of ion migration in Ag-alloy bonding wires using water drop tests indicated that a declining tendency of ion migration rates existed for various binary Ag-Pd and ternary Ag-Pd-Au alloy wires with increases in Pd and Au contents. Among the all Ag-alloy bonding wires in this study, the Ag-5Pd-3.5Au wire exhibited the lowest ion migration rate of 4.87 mu m/s. The measurements of anodic dissolution rates were consistent with the tendency of ion migration rates, which were dependent on Pd and Au contents, resulting in the low value of Ag-5Pd-3.5Au alloy wire (0.017 mu m/s).
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