A new approach for kinetic modeling and optimization of rubber molding

Although extensive research has been carried out on the understanding of the complex vulcanization process, the influence of reversion through exposure time and temperature on the vulcanization degree remains unclear. Therefore, the main aim of this study was a novel optimization approach that can help the industrial practitioners to select the optimal operating parameters, exposure time, and molding temperature, to achieve desired vulcanization degree of selected product. Spheres of four different diameters (2.5, 5, 10, and 20 cm) were selected as test geometry for simulation and optimization of rubber molding. Obtained vulcanization rheometer data for commercially available rubber blend (NR/SBR) were fitted by a new modeling approach, dividing vulcanization curve into two fitting sets: curing and reversion. The heat transfer equations for chosen geometry were coupled with proposed kinetic model. A new temperature-dependent kinetic parameter x, as the maximal reversion degree, was introduced, enabling determination of the lowest operating molding temperature (T-min = 132.36 degrees C), preventing high reversion and overheating of the rubber product. The final optimization goal was assessment of the optimal temperature and vulcanization time dependence on the rubber products dimensions. Proposed models have precise prediction with R-2 values greater than 0.8328 and MAPE less than 2.3099%.

Automated summary

This study aimed to investigate the influence of reversion through exposure time and temperature on the vulcanization degree in rubber molding, and propose a novel optimization approach for industrial practitioners to select optimal operating parameters. By fitting vulcanization rheometer data with a new modeling approach, the study introduced a temperature-dependent kinetic parameter to determine the lowest operating molding temperature and prevent high reversion of rubber products. The proposed models showed precise prediction capabilities with high accuracy values.