Journal
ORGANIC ELECTRONICS
Volume 88, Issue -, Pages -Publisher
ELSEVIER
DOI: 10.1016/j.orgel.2020.105968
Keywords
Resistance switching random access memory; Resistance switching filler; Flexible; Nano-composite ReRAM; Uniformity; Reliability
Funding
- National Research Foundation of Korea (NRF) - Korea government (MSIT) [2018R1C1B5045854]
- Technology Innovation Program - Ministry of Trade, Industry & Energy (MOTIE, Korea) [20003555]
- Basic Science Research Program through the National Research Foundation of Korea (NRF) - Korea government (MSIT) [2016R1A6A1A03013422]
- internal project of KIST
- Korea Evaluation Institute of Industrial Technology (KEIT) [20003555] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
- National Research Foundation of Korea [2018R1C1B5045854] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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A novel composite system using AgNW/TiO2 core-shell nanowires without heavy reliance on filler orientation or dispersion was proposed for improving the practical application performance of ReRAM devices.
Composite-based resistance switching random access memory (ReRAM) has great potential for application in flexible and wearable electronics. However, its large operating parameters and low reliability still have some limitations in realizing practical applications, which is derived from its high dependence on the orientation and dispersion of the filler in the composite layer. Here, we proposed a novel composite system that does not depend heavily on the orientation or dispersion of the fillers within the composite film of the ReRAM device. The AgNW/TiO2 core-shell nanowires inducing superb resistance switching behavior were fabricated. The composite resistance switching (RS) film was prepared by mixing the one-dimensional core-shell particles and poly (vinyl alcohol) (PVA) dielectric matrix. The composite RS film exhibited remarkable resistance switching behavior with extremely low/uniform operating voltage (V-set similar to 0.13 +/- 0.013 V, and V-reset similar to -0.10 +/- 0.012 V), and the reliable switching behavior was maintained for up to similar to 200,000 mechanical deformation cycles under 3 mm of bending radius. To evaluate the resistance switching mechanism of the composite-type ReRAM, the structural analysis and device modeling were performed.
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