Journal
OPTICAL MATERIALS
Volume 110, Issue -, Pages -Publisher
ELSEVIER
DOI: 10.1016/j.optmat.2020.110445
Keywords
PPDT2FBT; Optical dispersion; Spectroscopic ellipsometry; Refractive index; Extinction coefficient
Categories
Funding
- NORTHRUP GRUMMAN [2322623]
- National Science Foundation
- EPMD [1906492]
- Department of Navy HB CU/MI Program
- ONR [N000141912576]
- U.S. Department of Defense (DOD) [N000141912576] Funding Source: U.S. Department of Defense (DOD)
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Despite the recent increase in PPDT2FBT polymer thin film applications for optoelectronic devices, a comprehensive study of this material's optical dispersion properties is unavailable. The optical properties of the PPDT2FBT thin film is investigated using variable-angle spectroscopic ellipsometry (VASE) at ambient conditions. Knowledge of optical dispersion properties is essential for designing and fabricating optoelectronic devices such as solar cells, photodetectors, and photodiodes. In this research, we determined the dielectric function of PPDT2FBT thin film using the B-spline model and then reproduced the dielectric function using Psemi-Tri oscillators. We estimated the refractive index (n) of the thin film to be between 2.00 and 2.15 and the extinction coefficient (k) to be in the range of 1.14-1.39 at a wavelength of 632.8 nm. We further verified the estimated optical properties from the model using directly measured quantities such as transmission and absorption data obtained using the ultraviolet-visible (UV-Vis) spectrometer and thicknesses obtained using a surface profilometer. In addition, we determined the optical band gap of PPDT2FBT using the absorption coefficient.
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