Journal
NEUROIMAGE
Volume 224, Issue -, Pages -Publisher
ACADEMIC PRESS INC ELSEVIER SCIENCE
DOI: 10.1016/j.neuroimage.2020.117430
Keywords
Spatial resolution; Source estimation; Patch analysis; SNR; MEG; EEG
Funding
- NIH Neuroimaging Training Program (NTP) grant [5T32EB001680]
- NIH [R01NS104585, P41EB015896, P41EB030006, R01DC016765, R01DC016915]
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The limitation of low spatial resolution in magneto- and electroencephalography has not been unified quantified, with previous studies focusing on linear estimation methods without noise. A new approach is presented here to quantify the spatial fidelity of source estimates, allowing for evaluation of different methods under various conditions. Results show that spatial fidelity varies significantly with signal-to-noise ratio, providing insights for interpreting M/EEG source estimates and methods development.
Low spatial resolution is often cited as the most critical limitation of magneto- and electroencephalography (MEG and EEG), but a unifying framework for quantifying the spatial fidelity of M/EEG source estimates has yet to be established; previous studies have focused on linear estimation methods under ideal scenarios without noise. Here we present an approach that quantifies the spatial fidelity of M/EEG estimates from simulated patch activations over the entire neocortex superposed on measured resting-state data. This approach grants more generalizability in the evaluation process that allows for, e.g., comparing linear and non-linear estimates in the whole brain for different signal-to-noise ratios (SNR), number of active sources and activation waveforms. Using this framework, we evaluated the MNE, dSPM, sLORETA, eLORETA, and MxNE methods and found that the spatial fidelity varies significantly with SNR, following a largely sigmoidal curve whose shape varies depending on which aspect of spatial fidelity that is being quantified and the source estimation method. We believe that these methods and results will be useful when interpreting M/EEG source estimates as well as in methods development.Y
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