Optimum path planning of elliptic and cubic nanoparticles using one and dual probe atomic force microscopes

In this article, optimum path planning of elliptic and cubic nanoparticles by one and dual probe atomic force microscopes is investigated. Four different parameters are considered in the cost function, including area under critical time-force diagram, critical indentation depth, path smoothness and area under force-time diagram of primary impact of nanoparticles. Also three different obstacles are added to process to make it more real. The layout of obstacles are various in each geometry. Since surfaces are rough, the effects of roughness (surface and particle) are considered in process. Genetic algorithm method has been used for path planning.

Automated summary

This article investigates the optimum path planning for elliptical and cubic nanoparticles using one and dual probe atomic force microscopes. The cost function considers four different parameters, including area under critical time-force diagram, critical indentation depth, path smoothness, and area under force-time diagram of primary impact of nanoparticles. Three different obstacles are also added for more realistic simulations. The effects of roughness on both surface and particles are considered, and a genetic algorithm method is used for path planning.