Quantitative analysis of dispersion state for nearly two-dimensional systems

Many researchers attempted to quantify dispersion states of microstructures. Several algorithms to analyze micrographs are proposed to evaluate indicators reflecting the dispersion states. However, the values of these indicators can correlate several performances of a given system, to some degree. This paper proposes a new indicator, the degree of dispersion (DoD), that assesses the dispersion state by a random walk simulation and a cloud overlap estimation. The novelty of the proposed method is summarized as follows: firstly, the DoD possesses various features such as stability, effectivity, and flexibility; secondly, the DoD considers inter- and intracluster dispersions naturally; and finally, the DoD has an adjustable parameter that reflects different contexts of various applications. The computation time takes about 1-3 min for 600 by 600 pixels images. We believe that the DoD can be used in various industrial applications such as films, batteries, colloids, and nanocomposites.

Automated summary

A new indicator, the degree of dispersion (DoD), is proposed in this paper, which possesses features like stability, effectivity, and flexibility. It naturally considers inter- and intracluster dispersions, and has an adjustable parameter for different application contexts. The computation time is relatively short, around 1-3 minutes, making it suitable for various industrial applications.