Related references
Note: Only part of the references are listed.Degradation Assessment and Precursor Identification for SiC MOSFETs Under High Temp Cycling
Enes Ugur et al.
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS (2019)
Lifetime Estimation of Discrete IGBT Devices Based on Gaussian Process
Syed Huzaif Ali et al.
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS (2018)
Differential evolution-based multi-objective optimization for the definition of a health indicator for fault diagnostics and prognostics
P. Baraldi et al.
MECHANICAL SYSTEMS AND SIGNAL PROCESSING (2018)
Statistical degradation modeling and prognostics of multiple sensor signals via data fusion: A composite health index approach
Changyue Song et al.
IISE TRANSACTIONS (2018)
Remaining Useful Lifetime Estimation for Power MOSFETs Under Thermal Stress With RANSAC Outlier Removal
Serkan Dusmez et al.
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS (2017)
Aging Precursor Identification and Lifetime Estimation for Thermally Aged Discrete Package Silicon Power Switches
Serkan Dusmez et al.
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS (2017)
Evaluation of Vce at Inflection Point for Monitoring Bond Wire Degradation in Discrete Packaged IGBTs
Arun Singh et al.
IEEE TRANSACTIONS ON POWER ELECTRONICS (2017)
Online Condition Monitoring of Power MOSFET Gate Oxide Degradation Based on Miller Platform Voltage
Xuerong Ye et al.
IEEE TRANSACTIONS ON POWER ELECTRONICS (2017)
Artificial Intelligence Techniques in Smart Grid and Renewable Energy Systems-Some Example Applications
Bimal K. Bose
PROCEEDINGS OF THE IEEE (2017)
In Situ Condition Monitoring of High-Voltage Discrete Power MOSFET in Boost Converter Through Software Frequency Response Analysis
Serkan Dusmez et al.
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS (2016)
Remaining Useful Lifetime Estimation for Thermally Stressed Power MOSFETs Based on ON-State Resistance Variation
Serkan Dusmez et al.
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS (2016)
Analysis of the Results of Accelerated Aging Tests in Insulated Gate Bipolar Transistors
Daniel Astigarraga et al.
IEEE TRANSACTIONS ON POWER ELECTRONICS (2016)
Stochastic RUL Calculation Enhanced With TDNN-Based IGBT Failure Modeling
Alireza Alghassi et al.
IEEE TRANSACTIONS ON RELIABILITY (2016)
Metaheuristic Optimization Methods Applied to Power Converters: A Review
Susana Estefany De Leon-Aldaco et al.
IEEE TRANSACTIONS ON POWER ELECTRONICS (2015)
Computationally Efficient, Real-Time, and Embeddable Prognostic Techniques for Power Electronics
Alireza Alghassi et al.
IEEE TRANSACTIONS ON POWER ELECTRONICS (2015)
Discovering Prognostic Features Using Genetic Programming in Remaining Useful Life Prediction
Linxia Liao
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS (2014)
Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment
T. Santini et al.
MICROELECTRONICS RELIABILITY (2014)
Toward Reliable Power Electronics
Huai Wang et al.
IEEE INDUSTRIAL ELECTRONICS MAGAZINE (2013)
A Data-Level Fusion Model for Developing Composite Health Indices for Degradation Modeling and Prognostic Analysis
Kaibo Liu et al.
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING (2013)
A prognostic approach for non-punch through and field stop IGBTs
Nishad Patil et al.
MICROELECTRONICS RELIABILITY (2012)
A logistic approximation to the cumulative normal distribution
Shannon R. Bowling et al.
JOURNAL OF INDUSTRIAL ENGINEERING AND MANAGEMENT-JIEM (2009)
Share Paper
