Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 67, Issue 12, Pages 5669-5675Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2020.3031883
Keywords
Carbon; Schottky diodes; Temperature measurement; Schottky barriers; Contacts; Gallium; Sputtering; Carbon; Fermi level pinning (FLP); Schottky diodes; semiconductor interface
Funding
- Australian Research Council [DP200101905]
- Australian Research Council [DP200101905] Funding Source: Australian Research Council
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Graphitic (sp(2)-rich) carbon Schottky contacts to ((2) over bar 01) beta-Ga2O3 were fabricated using sputtering and energetic ion deposition with and without the use of an oxygen plasma. As-deposited contacts exhibited room temperature effective barrier heights between 0.80 and 1.20 eV, depending on the deposition technique. After moderate heat treatment (595 K in N-2) the work function of the oxygenated graphitic contacts increased by 0.5-0.8 eV. This resulted in a permanent increase in barrier height (up to 1.6 eV) and a corresponding 3-4 orders of magnitude increase in current rectification (at +/- 3 V). The barrier heights of the heat-treated oxygenated graphitic Schottky contacts agree well with the Mott-Schottky model, suggesting an absence of Fermi level pinning at the C/beta-Ga2O3 interface.
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