4.8 Article

Assessing the reliability of the Raman peak counting method for the characterization of SWCNT diameter distributions: a cross characterization with TEM

Journal

CARBON
Volume 171, Issue -, Pages 968-979

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.carbon.2020.09.012

Keywords

SWCNT; Raman; TEM; HRTEM; Metrology

Funding

  1. French Research Funding Agency [ANR-13-BS10-0015, ANR-18-CE09-0014-04]
  2. European Union [604472]
  3. Fund for Scientific Research Flanders (FWO) [1512716N, G040011N, G021112N, G036618N]
  4. FWO Postdoc Fellowship [12ZP720N]
  5. European Research Council [679841]
  6. Agence Nationale de la Recherche (ANR) [ANR-18-CE09-0014, ANR-13-BS10-0015] Funding Source: Agence Nationale de la Recherche (ANR)
  7. European Research Council (ERC) [679841] Funding Source: European Research Council (ERC)

Ask authors/readers for more resources

Resonant Raman spectroscopy is a widely used technique for characterizing single-walled carbon nanotubes, providing direct information on their structure. This study compared diameter distributions obtained through Raman peak counting with those from transmission electron microscopy, revealing differences due to chirality-dependence and the limited excitation wavelengths used. The effects of substrate and TEM-related biases were also discussed.
Resonant Raman spectroscopy is a widely used technique for single-walled carbon nanotube (SWCNT) characterization, in particular in the radial breathing mode (RBM) range which provides direct information on the structure of the nanotube in resonance. The RBM peak counting method, i.e. acquiring Raman spectrum grids on a substrate with a select set of discrete laser lines and counting RBM peaks as single nanotubes, is frequently used to characterize SWCNT growth samples, despite the many factors that can induce errors in the results. In this work, we cross-characterize the diameter distributions obtained through this methodology with diameter distributions obtained by counting SWCNT diameters in transmission electron microscopy (TEM) and discuss the different results and biases between the techniques. This study is performed on a broad diameter distribution sample, and on two chirality-enriched samples whose chirality distributions are determined by photoluminescence excitation spectroscopy (PLE) and statistical analysis of high resolution TEM (HRTEM) images. We show that the largest differences between the Raman peak counting and TEM diameter distributions stem from the chirality-dependence of SWCNT Raman cross-sections and the patchy vision offered by the use of only a few discrete excitation wavelengths. The effect of the substrate and TEM-related biases are also discussed. (C) 2020 Published by Elsevier Ltd.

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