4.6 Article

Thickness dependence of elliptical planar Hall effect magnetometers

Journal

APPLIED PHYSICS LETTERS
Volume 117, Issue 26, Pages -

Publisher

AIP Publishing
DOI: 10.1063/5.0033681

Keywords

-

Funding

  1. Planning and Budgeting Committee of the Council for Higher Education of Israel [vat/bat/cyc6/104]

Ask authors/readers for more resources

We fabricate elliptical planar Hall effect magnetometers with Permalloy thickness ranging between 25 and 200nm. We study the thickness dependence of their equivalent magnetic noise by examining the effect of the layer thickness on the signal and noise including Joule heating contributions. Sensors with a thickness of 50nm achieve equivalent magnetic noise as low as similar to 24 pT/ root Hz at 50Hz and similar to 36 pT/ root Hz at 10Hz, which are the best reported values for any type of magnetic sensor of similar or smaller size. These results are achieved without the use of magnetic flux concentrators, which helps to reduce the sensor volume while improving its spatial resolution and reducing the complexity and time of its production and, hence, its potential cost. We discuss different routes for further resolution improvements.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available