Journal
RESULTS IN PHYSICS
Volume 18, Issue -, Pages -Publisher
ELSEVIER
DOI: 10.1016/j.rinp.2020.103213
Keywords
Cadmium telluride; Thin film; Close-spaced sublimation; Deposition temperature; Ultra-thin glass substrate
Funding
- Ministry of Higher Education, Malaysia [FRGS/1/2019/STG07/UNITEN/02/1]
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In this study, cadmium telluride (CdTe) thin films were grown for the first time ever on ultra-thin (100 mu m) Schott D263T glass substrates via high temperature deposition process namely close-spaced sublimation (CSS). CdTe thin films were deposited under different source and substrate temperatures ranging from 500 degrees C to 700 degrees C to investigate the influence of deposition temperature on the properties of CdTe thin films grown on ultra-thin Schott glass substrates. X-ray diffraction (XRD) analysis illustrated cubic CdTe structure with a sharp peak at (1 1 1) orientation. The scanning electron microscope (SEM) study elucidated that the grain growth and surface morphology were highly dependent on the deposition temperature. UV-Vis results showed approximate optical band gap range of 1.61-1.66 eV. Carrier concentration and resistivity were found in the order of 10(13) cm(-3) and 10(5) Omega-cm, respectively. Structural and opto-electronic characteristics were optimized for the best temperature range to be used for CdTe film deposition in CSS growth. Optimum conditions for CdTe film growth on ultra-thin (100 mu m) substrate were found in the range of 500 degrees C-600 degrees C for substrate and source temperature.
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