4.5 Article

Reflective Single-Pixel Terahertz Imaging Based on Compressed Sensing

Journal

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TTHZ.2020.2982350

Keywords

Imaging; Laser beams; Image reconstruction; Measurement by laser beam; Diffraction; Lenses; Delay effects; Compressed sensing (CS); inverse Fresnel diffraction (IFD); reflection; terahertz (THz)

Funding

  1. National Natural Science Foundation of China [11474206, 11404224, 11774243, 11774246]
  2. Youth Innovative Research Team of Capital Normal University [008/19530050146]
  3. Beijing Nova Program [Z161100004916100]
  4. Capacity Building for Sci-Tech Innovation-Fundamental Scientific Research Funds [008/19530050170, 008/19530050180, 008/18530500186, 025185305000/142]

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The investigation of single-pixel terahertz (THz) imaging opens up a new research direction for the development of THz imaging technology. In this work, we exploit a reflective single-pixel THz imaging system based on photoinduced dynamic masks. By combining the compressed sensing and inverse Fresnel diffraction algorithms, a reflective THz spectral image is accurately reconstructed and the morphology of a sample is clearly observed. Three application potentials of the THz imaging system are fully proved, including time-of-flight measurement of a sample with multiple interfaces, noninvasive testing of a hidden object, and spectral identification of different chemical substances. The reflection-type measurement mode effectively improves the practicability of single-pixel THz imaging.

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