Characterization of hybrid organic/inorganic semiconductor materials for potential light emitting applications

The impact of inorganic semiconductor materials (TiO2, ZnO, WO3, and V2O5) on the structural, morphological, electrical and optical characteristics of the synthesized polyvinyl alcohol (PVA) was investigated. The fabricated thin films were deposited onto ITO glass substrates using the simple drop-casting technique. X-ray diffractometer (XRD) was used to examine the structural properties of the films. Fourier transform infrared spectroscopy (FTIR) to identify the chemical bonds and band shifts of the polymeric material. Filed emission scanning electron microscopy (FESEM) and atomic force microscopy (AFM) were used to characterize the morphology and surface roughness of the thin films. Electrical behaviour was obtained by Hall effect instrument, and optical spectrums were obtained by ultraviolet-visible (UV-Vis) spectroscopy. Photoluminescence (PL) spectra were utilized to locate the emission bands of the hybrid films. FTIR spectra confirm the hybridization of the organic PVA polymer with the inorganic semiconductor thin films. PVA/TiO2 thin film exhibited the largest grain size (26.7 nm), and the highest surface roughness (20.4 nm), conductivity (1.64 Omega cm, 745 cm(2)/V.s, and 5.11 x 10(15)/cm(3)), absorbance, and energy band gap (4 eV). While PVA/ZnO thin film presented the smallest grain size (15.4 nm), high surface roughness (12.4 nm), the lowest conductivity (844.70 Omega cm, 358 cm(2)/V.s, and 2.06 x 10(13)/cm(3)), high absorbance, and the lowest energy band gap (3.79 eV). The results of PL spectra confirm the potential application of the synthesized organic/inorganic hybrid materials (PVA/TiO2 and PVA/ZnO) in the manufacture of polymer light emitting diodes (PLEDs) due to their clear emission bands.