Journal
MEASUREMENT SCIENCE AND TECHNOLOGY
Volume 32, Issue 2, Pages -Publisher
IOP Publishing Ltd
DOI: 10.1088/1361-6501/abba4b
Keywords
silicon photomultiplier (SiPM); single photon avalanche diode (SPAD); characterization; dark noise; afterpulsing; time delay method; zero photon probability method
Funding
- Natural Sciences and Engineering Research Council of Canada (NSERC)
- Fonds de Recherche du Quebec-Nature et Technologies (FRQNT)
- Regroupement Strategique en Microsystemes du Quebec (ReSMiQ)
- Arthur B. McDonald Institute
- CMC Microsystems
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The characterization of nuisance parameters in digital SiPMs using ZPP and TD methods enables the correct separation of correlated and uncorrelated events, allowing for the determination of true PDE.
The characterization of nuisance parameters in digital silicon photomultipliers (SiPMs) is important to their understanding and future development. Methods able to distinguish the types of events are necessary to obtain fair and legitimate measurements. In this work, the zero photon probability (ZPP) method and the time delay (TD) method are used to measure the dark noise of digital SiPMs free from the contribution of correlated noise such as afterpulsing and crosstalk. It highlights the unique features of digital SiPMs such as the holdoff delay, the digital output signal, and the embedded processing (e.g. the selection of the interval sampling width). The two methods correctly separate the correlated and uncorrelated events in digital SiPMs and therefore the determination of a true photon detection efficiency (PDE) is possible. The ZPP method is also implemented inside a digital SiPM using embedded digital signal processing.
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